DETERMINATION OF IMPURITIES IN ARGON BY GAS-CHROMATOGRAPHY WITH A MICROWAVE-INDUCED PLASMA DETECTOR

被引：9
作者：
GEORGE, MA
HESSLER, JP
CARNAHAN, JW
机构：
[1] ARGONNE NATL LAB,DIV CHEM,9700 CASS AVE,ARGONNE,IL 60439
[2] NO ILLINOIS UNIV,DEPT CHEM,DE KALB,IL 60115
来源：
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 1989年 / 4卷 / 01期
关键词：
D O I：
10.1039/ja9890400051
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：51 / 54
页数：4
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