THIN-FILM ANALYSIS BY X-RAY-MICROANALYSIS USING GAUSSIAN-PI (RHO-Z) CURVES

被引:23
作者
HUNGER, HJ
机构
关键词
D O I
10.1002/sca.4950100203
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:65 / 72
页数:8
相关论文
共 31 条
[1]   EVALUATION OF THE USE OF GAUSSIAN PHI-(PZ) CURVES IN QUANTITATIVE ELECTRON-PROBE MICROANALYSIS - A NEW OPTIMIZATION [J].
BASTIN, GF ;
VANLOO, FJJ ;
HEIJLIGERS, HJM .
X-RAY SPECTROMETRY, 1984, 13 (02) :91-97
[2]  
BERGER HS, 1964, NAT ACAD SCI NAT RES, V1133, P205
[3]  
BISHOP HE, 1972, 7158 AER REP
[4]   Stopping power of atoms with several electrons [J].
Bloch, F. .
ZEITSCHRIFT FUR PHYSIK, 1933, 81 (5-6) :363-376
[5]   QUANTITATIVE ELECTRON-PROBE MICROANALYSIS USING GAUSSIAN PHI(RHO-ZETA) CURVES [J].
BROWN, JD ;
PACKWOOD, RH .
X-RAY SPECTROMETRY, 1982, 11 (04) :187-193
[6]   SUR LES BASES PHYSIQUES DE LANALYSE PONCTUELLE PAR SPECTROGRAPHIE-X [J].
CASTAING, R ;
DESCAMPS, J .
JOURNAL DE PHYSIQUE ET LE RADIUM, 1955, 16 (04) :304-317
[7]  
COLBY JW, 1968, ADVANCES XRAY ANALYS, V11, P287
[8]  
DJURIC B, 1969, 5TH ICXOM TUB, P99
[9]   ELECTRON-PROBE MICROANALYSIS APPLIED TO VERY THIN-LAYERS OF ALUMINUM-NICKEL ALLOYS [J].
DUZEVIC, D ;
BONEFACIC, A .
X-RAY SPECTROMETRY, 1978, 7 (03) :152-155
[10]   A STUDY OF ELECTRON BACKSCATTERING OF THIN-FILMS ON SUBSTRATES [J].
HUNGER, HJ ;
ROGASCHEWSKI, S .
SCANNING, 1986, 8 (06) :257-263