HIGH-RESOLUTION GAMMA-SPECTROSCOPY WITH IDEAL CRYSTALS

被引:1
作者
JUNGCLAUS, A [1 ]
BORNER, HG [1 ]
机构
[1] UNIV GOTTINGEN, INST PHYS 2, W-3400 GOTTINGEN, GERMANY
关键词
D O I
10.1016/0168-9002(94)90171-6
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We report on the resolving power obtained with flat and bent crystal spectrometers at the Institut Laue-Langevin for gamma-ray diffraction at very short wavelengths. It is shown that for flat crystals even in the MeV range one can obtain nearly perfect resolution close to that predicted by the dynamical diffraction theory. In order to further improve the quality of cylindrical crystal bending, a new device has been designed and we give the results obtained in a first test of this new crystal bender using X-ray reflection.
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页码:120 / 124
页数:5
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