DETERMINATION OF DEVICE NOISE AND GAIN PARAMETERS

被引：36

作者：

SANNINO, M

机构：

[1] Istituto di Elettrotecnica ed Elettronica, Universita di Palermo, Palermo, 90128, viale delle Scienze

来源：

PROCEEDINGS OF THE IEEE | 1979年 / 67卷 / 09期

关键词：

D O I：

10.1109/PROC.1979.11458

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The least-squares fitting of measured noise figures and gains versus input termination admittance is an established procedure to determine linear two-port noise and gain parameters. Unfortunately, the method is liable to the serious inconvenience of yielding often erroneous results or even results without physical meaning. Some criteria are suggested which allow the carrying out of measurements in such a manner as to safely avoid the above drawbacks. © 1979 IEEE.

引用

页码：1364 / 1366

页数：3