THE BEHAVIOR AND CALIBRATION OF SOME PIEZOELECTRIC CERAMICS USED IN THE STM

被引：59

作者：

VIEIRA, S

机构：

来源：

IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1986年 / 30卷 / 05期

关键词：

D O I：

10.1147/rd.305.0553

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：553 / 556

页数：4

共 7 条

[1] DETERMINATION OF SURFACE-TOPOGRAPHY OF BIOLOGICAL SPECIMENS AT HIGH-RESOLUTION BY SCANNING TUNNELLING MICROSCOPY [J].

BARO, AM ;

MIRANDA, R ;

ALAMAN, J ;

GARCIA, N ;

BINNIG, G ;

ROHRER, H ;

GERBER, C ;

CARRASCOSA, JL .

NATURE, 1985, 315 (6016) :253-254

[2] PIEZOELECTRIC CERAMIC DISPLACEMENT CHARACTERISTICS AT LOW-FREQUENCIES AND THEIR CONSEQUENCES IN FABRY-PEROT INTERFEROMETRY [J].

BASEDOW, RW ;

COCKS, TD .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (08) :840-844

[3] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].

BINNING, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61

[4] CREEP IN A PRECIPITATION-HARDENED ALLOY [J].

DAVIS, M ;

THOMPSON, N .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1950, 63 (371) :847-860

[5]

PLESSNER KW, 1956, P PHYS SOC A, V69, P1121

[6] A STUDY OF MAGNETIC VISCOSITY [J].

STREET, R ;

WOOLLEY, JC .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION A, 1949, 62 (357) :562-572

[7] SILICON CELL FOR THE PRECISE MEASUREMENT OF THERMAL-EXPANSION AT LOW-TEMPERATURES - RESULTS FOR CU AND NAF [J].

VILLAR, R ;

HORTAL, M ;

VIEIRA, S .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (01) :27-31

← 1 →