ANODIC-STRIPPING COULOMETRY AT A THIN-FILM MERCURY-ELECTRODE

被引：8

作者：

EGGLI, R ^{[1
]}

机构：

[1] UNIV ZURICH,INST INORGAN CHEM,CH-8001 ZURICH,SWITZERLAND

来源：

ANALYTICA CHIMICA ACTA | 1977年 / 91卷 / 02期

关键词：

D O I：

10.1016/S0003-2670(01)93652-9

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：129 / 138

页数：10

共 11 条

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[7] CONTRIBUTION TO PROBLEM OF INCREASING SENSITIVITY OF ANODIC-STRIPPING VOLTAMMETRY [J].

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[8] COULOMETRIC ANALYSIS [J].

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[9] COULOMETRIC DETERMINATION OF SUBMICROGRAM AMOUNTS OF SILVER [J].

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ANALYTICAL CHEMISTRY, 1952, 24 (01) :209-213

[10] END POINT LOCATION IN CONTROLLED-POTENTIAL COULOMETRIC ANALYSIS [J].

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