DETERMINATION OF POINT-DEFECT PARAMETERS FROM SILVER DIFFUSION DATA

被引：12

作者：

BURTON, JJ ^{[1
]}

FROOZAN, F ^{[1
]}

机构：

[1] COLUMBIA UNIV,HENRY KRUMB SCH MINES,NEW YORK,NY 10027

来源：

PHILOSOPHICAL MAGAZINE | 1973年 / 27卷 / 02期

关键词：

D O I：

10.1080/14786437308227421

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：473 / 480

页数：8

共 50 条

[21] POINT-DEFECT PARAMETERS IN THE SYSTEM CSCL-TLCL
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