CROSS-CORRELATION METHOD FOR INTENSITY MEASUREMENT OF TRANSMISSION ELECTRON-DIFFRACTION PATTERNS

被引：36

作者：

XU, P

JAYARAM, G

MARKS, LD

机构：

[1] Department of Materials Science and Engineering, Northwestern University, Evanston

来源：

ULTRAMICROSCOPY | 1994年 / 53卷 / 01期

关键词：

D O I：

10.1016/0304-3991(94)90100-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

This paper describes a method of intensity measurement of diffraction spots from digitized negatives using cross-correlation. The method is highly robust against noise and diffuse background in the diffraction pattern; therefore intensities of very weak spots such as those due to a reconstructed surface can be measured accurately. The reliability of this method and the implication for a quantitative structure analysis by transmission electron diffraction are discussed.

引用

页码：15 / 18

页数：4

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