CROSS-CORRELATION METHOD FOR INTENSITY MEASUREMENT OF TRANSMISSION ELECTRON-DIFFRACTION PATTERNS

被引：36
|
作者：
XU, P
JAYARAM, G
MARKS, LD
机构：
[1] Department of Materials Science and Engineering, Northwestern University, Evanston
来源：
ULTRAMICROSCOPY | 1994年 / 53卷 / 01期
关键词：
D O I：
10.1016/0304-3991(94)90100-7
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
This paper describes a method of intensity measurement of diffraction spots from digitized negatives using cross-correlation. The method is highly robust against noise and diffuse background in the diffraction pattern; therefore intensities of very weak spots such as those due to a reconstructed surface can be measured accurately. The reliability of this method and the implication for a quantitative structure analysis by transmission electron diffraction are discussed.
引用
收藏
页码：15 / 18
页数：4
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