共 48 条
[1]
Scanning acoustic microscopy as a non-destructive imaging tool to localize defects inside battery cells
[J].
JOURNAL OF POWER SOURCES ADVANCES,
2020, 6
[2]
Berckmans G, 2018, WORLD ELECTR VEHIC J, V9, P43, DOI [10.3390/wevj9030043, 10.3390/wevj9030043, DOI 10.3390/WEVJ9030043]
[5]
Non-destructive wafer-level bond defect identification by scanning acoustic microscopy
[J].
MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS,
2015, 21 (07)
:1385-1394
[7]
Brekow G., 1996, WERKST KORROS, V47, P578