CRYOSTAT FOR MEASURING THE ELECTRICAL PROPERTIES OF HIGH RESISTANCE SEMICONDUCTORS AT LOW TEMPERATURES

被引：15

作者：

MITCHELL, WH

PUTLEY, EH

机构：

来源：

JOURNAL OF SCIENTIFIC INSTRUMENTS | 1959年 / 36卷 / 03期

关键词：

D O I：

10.1088/0950-7671/36/3/308

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：134 / 136

页数：3

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