CRYOSTAT FOR MEASURING THE ELECTRICAL PROPERTIES OF HIGH RESISTANCE SEMICONDUCTORS AT LOW TEMPERATURES

被引：15
作者：
MITCHELL, WH
PUTLEY, EH
机构：
来源：
JOURNAL OF SCIENTIFIC INSTRUMENTS | 1959年 / 36卷 / 03期
关键词：
D O I：
10.1088/0950-7671/36/3/308
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
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页码：134 / 136
页数：3
相关论文
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