MICROELECTRONIC TEST CHIPS IN INTEGRATED-CIRCUIT MANUFACTURING

被引：0

|

作者：

PERLOFF, DS

MALLORY, CL

WAHL, FE

MYLROIE, SW

机构：

来源：

SOLID STATE TECHNOLOGY | 1981年 / 24卷 / 09期

关键词：

Compendex;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

INTEGRATED CIRCUIT MANUFACTURE

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页码：75 / 80

页数：6

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