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- [3] Dopant and Carrier Concentration Profiling with Atomic Resolution by Scanning Tunneling Microscopy ADVANCED GATE STACK, SOURCE/DRAIN, AND CHANNEL ENGINEERING FOR SI-BASED CMOS 5: NEW MATERIALS, PROCESSES, AND EQUIPMENT, 2009, 19 (01): : 117 - 126
- [6] Atomic force microscopy/scanning tunneling microscopy Journal of the American Chemical Society, 1996, 118 (04):
- [7] ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY WITH A COMBINATION ATOMIC FORCE MICROSCOPE SCANNING TUNNELING MICROSCOPE JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (03): : 2089 - 2092
- [8] MEDIUM-RESOLUTION AND LOW-RESOLUTION SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPY ANNALES DE CHIMIE-SCIENCE DES MATERIAUX, 1992, 17 (3-4): : 191 - 203
- [9] ATOMIC THEORY OF SCANNING TUNNELING MICROSCOPY PHYSICAL REVIEW B, 1989, 40 (15): : 10286 - 10293
- [10] SCANNING TUNNELING MICROSCOPY, AN ATOMIC PROBE SCANNING ELECTRON MICROSCOPY, 1983, : 1079 - 1082