ON THE VISUAL ESTIMATION OF X-RAY REFLEXION INTENSITIES FROM UPPER-LEVEL WEISSENBERG PHOTOGRAPHS

被引:299
作者
PHILLIPS, DC
机构
关键词
D O I
10.1107/S0365110X54002265
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:746 / 751
页数:6
相关论文
共 9 条
[1]   AN INTEGRATING PHOTOMETER FOR X-RAY INTENSITY MEASUREMENTS [J].
ALEXANDER, E ;
FRAENKEL, BS ;
MANY, A ;
STEINBERGER, IT .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1953, 24 (10) :955-960
[2]  
[Anonymous], 1942, XRAY CRYSTALLOGRAPHY
[3]   THE CORRECTION OF X-RAY INTENSITIES FOR POLARIZATION AND LORENTZ FACTORS [J].
COCHRAN, W .
JOURNAL OF SCIENTIFIC INSTRUMENTS AND OF PHYSICS IN INDUSTRY, 1948, 25 (07) :253-254
[4]   THE MEASUREMENT AND CORRECTION OF INTENSITIES FROM SINGLE-CRYSTAL X-RAY PHOTOGRAPHS [J].
KAAN, G ;
COLE, WF .
ACTA CRYSTALLOGRAPHICA, 1949, 2 (01) :38-43
[5]  
LONSDALE K, 1945, MINERALOG MAG, V27, P112
[6]  
PHILLIPS D C, 1950, Research, V3, P578
[8]   PHOTOMETRY OF SINGLE-CRYSTAL X-RAY PHOTOGRAPHS [J].
WALLWORK, SC ;
STANDLEY, KJ .
ACTA CRYSTALLOGRAPHICA, 1954, 7 (03) :272-275
[9]   AN INTEGRATING WEISSENBERG APPARATUS FOR X-RAY ANALYSIS [J].
WIEBENGA, EH ;
SMITS, DW .
ACTA CRYSTALLOGRAPHICA, 1950, 3 (04) :265-&