EVIDENCE FOR INTERNAL ROTATION IN THE FINE STRUCTURE OF THE INFRARED ABSORPTION OF OXYGEN IN SILICON

被引：71

作者：

HROSTOWSKI, HJ

ALDER, BJ

机构：

来源：

关键词：

D O I：

10.1063/1.1731397

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：980 / 990

页数：11

共 17 条

[1]

BOND WL, UNPUBLISHED

[2] LATTICE VIBRATIONS IN SILICON AND GERMANIUM [J].

BROCKHOUSE, BN .

[3] The two-minima problem and the ammonia molecule [J].

Dennison, DM ;

Uhlenbeck, GE .

PHYSICAL REVIEW, 1932, 41 (03) :313-321

[4]

FULLER, 1954, PHYS REV, V96, P833

[5]

FULLER, 1955, ACTA METALLURGICA, V3, P1

[6] THERMAL EXPANSION OF SOME CRYSTALS WITH THE DIAMOND STRUCTURE [J].

GIBBONS, DF .

PHYSICAL REVIEW, 1958, 112 (01) :136-140

[7]

HERTZBERG G, 1945, INFRARED RAMAN SPECT, P252

[8]

HIRSCHFELDER JO, 1954, MOL THEORY GASES LIQ, P32

[9] INFRARED SPECTRA OF HEAT TREATMENT CENTERS IN SILICON [J].

HROSTOWSKI, HJ ;

KAISER, RH .

[10] THE SOLUBILITY OF OXYGEN IN SILICON [J].

HROSTOWSKI, HJ ;

KAISER, RH .