X-RAY RADIOMETRIC ANALYSIS OF ORES AND MINERALS USING APPARATUS BASED ON SEMICONDUCTOR-DETECTORS

被引:2
作者
YAKUBOVICH, AL
PRZHIYALGOVSKY, SM
TSAMERIAN, GN
ROSCHINA, IA
机构
来源
JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1980年 / 57卷 / 02期
关键词
D O I
10.1007/BF02516755
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
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页码:447 / 460
页数:14
相关论文
共 9 条
[1]   SCATTERED X-RAYS AS INTERNAL STANDARDS IN X-RAY EMISSION SPECTROSCOPY [J].
ANDERMANN, G ;
KEMP, JW .
ANALYTICAL CHEMISTRY, 1958, 30 (08) :1306-1309
[2]   SEMICONDUCTOR X-RAY SPECTROMETERS [J].
MUGGLETON, AH .
NUCLEAR INSTRUMENTS & METHODS, 1972, 101 (01) :113-+
[3]  
PLOTNIKOV RI, 1973, FLUORESTSENTNY RENTG
[4]  
WALTER FJ, 1970, IEEE T NUCLEAR SCI, V17
[5]  
Woldseth R., 1973, XRAY ENERGY SPECTROM
[6]   X-RAY RADIOMETRIC ANALYSIS OF ELEMENT COMPOSITION OF MATERIALS [J].
YAKUBOVICH, AL .
JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1970, 5 (01) :79-+
[7]  
YAKUBOVICH AL, 1972, RAZVEDKA OKHRANA NED, P28
[8]  
YAKUBOVICH AL, 1973, YADERNOFIZICHESKIE M
[9]  
YAKUBOVICH AL, 1972, ATOM ENERG, V32, P241