PIEZORESISTIVE PROPERTIES UNDER HYDROSTATIC-PRESSURE OF SILICON LAYERS SEPARATED BY OXYGEN IMPLANTATION

被引:0
作者
VETTESE, F
SICART, J
ROBERT, JL
机构
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1989年 / 2卷 / 1-3期
关键词
D O I
10.1016/0921-5107(89)90091-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:163 / 166
页数:4
相关论文
共 18 条
[1]   SPECIFIC FEATURES OF PIEZOGALVANOMAGNETIC EFFECTS IN OXYGEN-CONTAINING SILICON-CRYSTALS IN THE PRESENCE OF THERMAL DONORS-I AND DONORS-II [J].
BABICH, VM ;
BARAN, NP ;
BORBLIK, VL ;
DOTSENKO, YP ;
KOVALCHUK, VB ;
SHERSHEL, VA .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 84 (01) :263-268
[2]   STUDY OF SILICON-OXIDES PREPARED BY OXYGEN IMPLANTATION INTO SILICON [J].
BADAWI, MH ;
ANAND, KV .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1977, 10 (14) :1931-1942
[3]  
BARBICH VM, 1987, SOV PHYS SEMICOND+, V21, P610
[4]   PIEZORESISTIVE COEFFICIENTS IN SILICON DIFFUSED LAYERS [J].
CONTI, F ;
MORTEN, B ;
NOBILI, C ;
TARONI, A .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1973, 17 (01) :K29-K31
[5]   THERMAL DONOR AND NEW DONOR GENERATION IN SOI MATERIAL FORMED BY OXYGEN IMPLANTATION [J].
CRISTOLOVEANU, S ;
PUMFREY, J ;
SCHEID, E ;
HEMMENT, PLF ;
ARROWSMITH, RP .
ELECTRONICS LETTERS, 1985, 21 (18) :802-804
[6]   SILICON FILMS ON SAPPHIRE [J].
CRISTOLOVEANU, S .
REPORTS ON PROGRESS IN PHYSICS, 1987, 50 (03) :327-371
[7]  
HAOND M, 1985, ENERGY BEAM SOLID IN, P417
[8]   SILICON-ON-INSULATOR BY OXYGEN ION-IMPLANTATION [J].
LAM, HW ;
PINIZZOTTO, RF .
JOURNAL OF CRYSTAL GROWTH, 1983, 63 (03) :554-558
[10]   SELF-INTERSTITIALS AND THERMAL DONOR FORMATION IN SILICON - NEW MEASUREMENTS AND A MODEL FOR THE DEFECTS [J].
NEWMAN, RC ;
OATES, AS ;
LIVINGSTON, FM .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1983, 16 (19) :L667-L674