THE INFLUENCE OF SECONDARY FLUORESCENCE FROM ELEMENTS ADJACENT TO THE MICROBEAM SPOT ON LOCAL CONCENTRATION DETERMINATION WITH PIXE

被引：6
作者：
HECK, D
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS | 1981年 / 181卷 / 1-3期
关键词：
D O I：
10.1016/0029-554X(81)90595-4
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
8
引用
收藏
页码：135 / 139
页数：5
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