THE PROBABILITY OF A SUBSPACE SWAP IN THE SVD

被引：100

作者：

THOMAS, JK ^{[1
]}

SCHARF, JL ^{[1
]}

TUFTS, DW ^{[1
]}

机构：

[1] UNIV RHODE ISL,DEPT ELECT ENGN,KINGSTON,RI 02881

来源：

IEEE TRANSACTIONS ON SIGNAL PROCESSING | 1995年 / 43卷 / 03期

关键词：

D O I：

10.1109/78.370627

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper we extend the work of Tufts, Kot, and Vaccaro (TKV) to improve the analytical characterization of threshold breakdown in SVD methods. Our results sharpen the TKV results by lower bounding the probability of a subspace swap in the SVD. Our key theoretical result is the characteristic function for a random variable whose probability of exceeding zero bounds the probability of a threshold breakdown.

引用

页码：730 / 736

页数：7

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