MEASUREMENT OF ETCHING AFTER IRRADIATION WITH CHARGED-PARTICLES BY USING THE MATRIX ACTIVATION

被引：2
作者：
VALLADON, M
BLONDIAUX, G
GIOVAGNOLI, A
KOEMMERER, C
DEBRUN, JL
机构：
来源：
ANALYTICA CHIMICA ACTA | 1980年 / 116卷 / 01期
关键词：
D O I：
10.1016/S0003-2670(01)84310-5
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：25 / 32
页数：8
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