共 50 条
- [42] LASER ANNEALING OF NITROGEN AND OXYGEN ION-IMPLANTED SILICON LAYERS MATERIALS CHEMISTRY, 1979, 4 (03): : 565 - 569
- [44] DISTRIBUTION OF AN ION-IMPLANTED IMPURITY IN SILICON AFTER REPEATED PULSED ELECTRON ANNEALING SOVIET PHYSICS SEMICONDUCTORS-USSR, 1987, 21 (02): : 218 - 219
- [47] ANOMALOUS DOPANT REDISTRIBUTION IN ND-YAG LASER ANNEALED LOW-ENERGY ION-IMPLANTED SILICON JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (5A): : 1287 - 1289
- [49] CONDUCTIVITY CHANGES AND IMPURITY DEFECT INTERACTIONS IN ION-IMPLANTED AMORPHOUS-SILICON NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 80-1 : 603 - 606