LASER EXPERIMENTS IN A SCANNING ELECTRON-MICROSCOPE

被引:3
作者
WETZIG, K
MENZEL, S
机构
[1] Institut für Strukturforschung und Festkörperanalytik des ZFW Dresden, Dresden, D-O-8027
关键词
LASER; SCANNING ELECTRON MICROSCOPE; PVD; LANGMUIR PROBE MEASUREMENTS;
D O I
10.1007/BF01244486
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
In order to increase the information content of electron microscopic investigations a scanning electron microscope was combined with a pulsed Nd-glass laser in both the free running and the Q-switch mode. The equipment allows an in situ observation of melting, sintering and evaporation processes as well as of crack generation and growth at target surfaces. This article describes evaporation experiments for laser PVD of HTSC layers, Langmuir probe measurements in the corresponding plasma and crack processes by thermal shock loading in the SEM.
引用
收藏
页码:311 / 318
页数:8
相关论文
共 11 条
  • [1] CHAPLIEV NI, 1985, 2 P INT C TRENDS QUA, P197
  • [2] DAALDER JE, 1976, J PHYSICA D, V9, P2395
  • [3] DELLE W, 1987, BERICHTE KERNFORSCHU
  • [4] EXNER J, 1991, ZFW0191ISF FORSCH BE
  • [5] Hauffe W, 1990, BEITR ELEKTRONENMIKR, V23, P305
  • [6] MENZEL S, IN PRESS J MATER SCI
  • [7] SYSTEMATICS OF THIN-FILMS FORMED BY EXCIMER LASER ABLATION - RESULTS ON SMBA2CU3O7
    NEIFELD, RA
    GUNAPALA, S
    LIANG, C
    SHAHEEN, SA
    CROFT, M
    PRICE, J
    SIMONS, D
    HILL, WT
    [J]. APPLIED PHYSICS LETTERS, 1988, 53 (08) : 703 - 704
  • [8] POMPE W, IN PRESS J PHYSICS D
  • [9] PUELL H, 1970, Z NATURFORSCH PT A, VA 25, P1807
  • [10] LASEM - A NOVEL COMBINED DEVICE FOR LASER MODIFICATION IN SEM
    WETZIG, K
    EDELMANN, J
    FISCHER, W
    MUELLER, H
    [J]. SCANNING, 1987, 9 (03) : 99 - 107