FORWARD CHARACTERISTICS OF SI SCHOTTKY DIODES

被引:1
作者
MORINO, A
SUGANO, T
机构
关键词
D O I
10.1143/JJAP.9.1484
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1484 / &
相关论文
共 50 条
[21]   DC characteristics of the SiC Schottky diodes [J].
Janke, W. ;
Hapka, A. ;
Oleksy, M. .
BULLETIN OF THE POLISH ACADEMY OF SCIENCES-TECHNICAL SCIENCES, 2011, 59 (02) :183-188
[22]   Characteristics of TiNx/n-Si Schottky diodes deposited by reactive magnetron sputtering [J].
Dimitriadis, CA ;
Lee, JI ;
Patsalas, P ;
Logothetidis, S ;
Tassis, DH ;
Brini, J ;
Kamarinos, G .
JOURNAL OF APPLIED PHYSICS, 1999, 85 (08) :4238-4242
[23]   EFFECTS OF HYDROGENATION ON THE ELECTRICAL CHARACTERISTICS OF NI/N-SI(111) SCHOTTKY DIODES [J].
SAHAY, PP ;
SHAMSUDDIN, M ;
SRIVASTAVA, RS .
SOLID-STATE ELECTRONICS, 1991, 34 (07) :727-729
[24]   CHARACTERISTICS OF SCHOTTKY DIODES WITH MICROCLUSTER INTERFACE [J].
SCHNEIDER, MV ;
CHO, AY ;
KOLLBERG, E ;
ZIRATH, H .
APPLIED PHYSICS LETTERS, 1983, 43 (06) :558-560
[25]   Thermal stress effects on capacitance and current characteristics of Cu/Si and Cu/TiN/Si Schottky-diodes [J].
Ahrens, C ;
Ferretti, R ;
Friese, G ;
Weidner, JO .
MICROELECTRONIC ENGINEERING, 1997, 37-8 (1-4) :211-219
[26]   Nonlinear analysis of the I-V characteristics in Ti/Si and TiSi2/Si Schottky diodes [J].
PerezRigueiro, J ;
Jimenez, C ;
PerezCasero, R ;
MartinezDuart, JM .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (04) :2623-2626
[27]   Thermal stress effects on capacitance and current characteristics of Cu/Si and Cu/TiN/Si Schottky-diodes [J].
Ahrens, C. ;
Ferretti, R. ;
Friese, G. ;
Weidner, J.O. .
Microelectronic Engineering, 1997, 37-38 :211-219
[28]   Effect of series resistance on the forward current-voltage characteristics of Schottky diodes in the presence of interfacial layer [J].
Ayyildiz, E ;
Turut, A ;
Efeoglu, H ;
Tuzemen, S ;
Saglam, M ;
Yogurtcu, YK .
SOLID-STATE ELECTRONICS, 1996, 39 (01) :83-87
[29]   Electrical characteristics and inhomogeneous barrier analysis of Al/NPB/p-Si Schottky diodes [J].
Huang, Wen-Chang ;
Chen, Chien-Chou .
MICROELECTRONIC ENGINEERING, 2011, 88 (03) :287-292
[30]   Forward current transport and noise behavior of GaN Schottky diodes [J].
Yan, Da-Wei ;
Tian, Kui-Kui ;
Yan, Xiao-Hong ;
Li, Wei-Ran ;
Yu, Dao-Xin ;
Li, Jin-Xiao ;
Cao, Yan-Rong ;
Gu, Xiao-Feng .
Wuli Xuebao/Acta Physica Sinica, 2021, 70 (08)