MEASUREMENT OF INELASTIC ELECTRON-SCATTERING CROSS-SECTIONS BY ELECTRON ENERGY-LOSS SPECTROSCOPY

被引：45
作者：
CROZIER, PA [1 ]
机构：
[1] UNIV ALBERTA,DEPT PHYS,EDMONTON T6G 2J1,ALBERTA,CANADA
来源：
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1990年 / 61卷 / 03期
关键词：
D O I：
10.1080/13642819008208637
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Absolute inelastic-electron-scattering cross-sections have been measured in solids at 100 keV from a range of elements in the periodic table. Total inelastic crosssections integrated over all atomic shells and inner-shell cross-sections have been determined. Comparison is made with previous experimental and theoretical data. © 1990 Taylor & Francis Ltd.
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页码：311 / 336
页数：26
相关论文
共 53 条
[1]   ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION [J].
BISHOP, HE ;
RIVIERE, JC .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) :1740-&
[2]   ELASTIC-SCATTERING IN EELS - FUNDAMENTAL CORRECTIONS TO QUANTIFICATION [J].
BOURDILLON, AJ ;
STOBBS, WM .
ULTRAMICROSCOPY, 1985, 17 (02) :147-149
[3]  
BRUNGER W, 1965, Z PHYS, V124, P271
[4]  
CARPENTER RW, 1986, 44TH ANN P EL MICR S, P718
[5]   MEASUREMENT OF FOIL THICKNESS AND EXTINCTION DISTANCE BY CONVERGENT BEAM TRANSMISSION ELECTRON-MICROSCOPY [J].
CASTROFERNANDEZ, FR ;
SELLARS, CM ;
WHITEMAN, JA .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1985, 52 (03) :289-303
[6]   UNDERSTANDING THIN-FILM X-RAY-SPECTRA [J].
CHAPMAN, JN ;
NICHOLSON, WAP ;
CROZIER, PA .
JOURNAL OF MICROSCOPY-OXFORD, 1984, 136 (NOV) :179-191
[7]   DEADTIME CORRECTIONS FOR A PULSE COUNTING SYSTEM IN ELECTRON-ENERGY LOSS SPECTROSCOPY [J].
CHENG, SC ;
CROZIER, PA ;
EGERTON, RF .
JOURNAL OF MICROSCOPY-OXFORD, 1987, 148 :285-288
[8]  
COLLIEX C, 1984, QUANTITATIVE ELECTRO, P149
[9]   CORRECTING ELECTRON-ENERGY LOSS SPECTRA FOR ARTIFACTS INTRODUCED BY A SERIAL DATA-COLLECTION SYSTEM [J].
CRAVEN, AJ ;
BUGGY, TW .
JOURNAL OF MICROSCOPY-OXFORD, 1984, 136 (NOV) :227-239
[10]   MASS-THICKNESS DETERMINATION BY BETHE-SUM-RULE NORMALIZATION OF THE ELECTRON ENERGY-LOSS SPECTRUM [J].
CROZIER, PA ;
EGERTON, RF .
ULTRAMICROSCOPY, 1989, 27 (01) :9-18
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