Determination of the complex permittivity of dielectric materials at microwave frequency using rectangular waveguide measurements and Newton-Raphson method

被引：4

作者：

Terhzaz, J. ^{[1
]}

Ammor, H. ^{[1
]}

Mediavilla Sanchez, A. ^{[2
]}

Chaibi, M. ^{[2
]}

Mamouni, A. ^{[3
]}

机构：

[1] EMI, Lab Elect & Commun, Av Ibn Sina,BP 765, Rabat, Morocco

[2] Univ Cantabria, Commun Engn Dept, Santander, Cantabria, Spain

[3] IEMI CNRS Cite Sci, Inst Elect Microelect & Nanotechnol, Villeneuve Dascq, France

来源：

MATERIAUX & TECHNIQUES | 2006年 / 94卷 / 03期

关键词：

Material characterization; experimental methods; isotropic homogeneous materials;

D O I：

10.1051/mattech:2006039

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this paper, a simple waveguide measurement technique is presented to determine the complex permittivity of a dielectric material. The dielectric sample is loaded in a short-circuited rectangular waveguide. The reflection coefficient of the waveguide is measured by Network analyser and calculated as a function of the complex permittivity using theory of transmissions lines. The Newton Raphson method is then used to determine de complex permittivity by matching the calculated value with the measured value. The results obtained using Newton Raphson are in good agreement with the results obtained by the Nicholson-Ross technique.

引用

页码：227 / 233

页数：7

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