MAGNETIC FIELD MEASUREMENTS IN SCANNING ELECTRON MICROSCOPE

被引：24
|
作者：
THORNLEY, RF
HUTCHINS.JD
机构：
来源：
APPLIED PHYSICS LETTERS | 1968年 / 13卷 / 08期
关键词：
D O I：
10.1063/1.1652595
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：249 / &
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