DETERMINATION OF TRACE-ELEMENTS IN ALUMINUM WITH SYNCHROTRON RADIATION-INDUCED X-RAY-FLUORESCENCE

被引：13

作者：

CHEVALLIER, P

ABBAS, K

SAINFORT, P

机构：

[1] CTR RECH VOREPPE,F-38340 VOREPPE,FRANCE

[2] UNIV PIERRE & MARIE CURIE,LPAN,BAT 209D,F-91405 ORSAY,FRANCE

[3] LAB UTILISAT RAYONNEMENT ELECTROMAGNET,F-91405 ORSAY,FRANCE

来源：

X-RAY SPECTROMETRY | 1991年 / 20卷 / 06期

关键词：

D O I：

10.1002/xrs.1300200609

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

A systematic study of trace elements in aluminium has been undertaken. Calibration graphs and detection limits were deduced for various excitation energies.

引用

页码：293 / 295

页数：3