SILICON-INTERSTITIAL OXYGEN-INTERSTITIAL COMPLEX AS A MODEL OF THE 450-DEGREES-C OXYGEN THERMAL DONOR IN SILICON

被引:25
作者
DEAK, P
SNYDER, LC
CORBETT, JW
机构
[1] SUNY ALBANY, DEPT CHEM, ALBANY, NY 12222 USA
[2] SUNY ALBANY, DEPT PHYS, ALBANY, NY 12222 USA
关键词
D O I
10.1103/PhysRevLett.66.747
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The complex of a divalent silicon interstitial and a pair of adjacent oxygen interstitials is proposed as the core of the 450-degrees-C oxygen thermal donor in silicon. The proposal is supported by theoretical calculations which suggest that this complex is stable relative to the self-interstitial and two separated oxygen interstitials, and that it has a doubly occupied level close to the computed conduction-band edge. The calculated spin distribution is in qualitative agreement with the one found experimentally for the NL8 center.
引用
收藏
页码:747 / 749
页数:3
相关论文
共 15 条
  • [1] BRELOT A, 1973, RAD DAMAGE DEFECTS S, P191
  • [2] EVALUATION OF SEMIEMPIRICAL QUANTUM-CHEMICAL METHODS IN SOLID-STATE APPLICATIONS .2. CYCLIC-CLUSTER CALCULATIONS OF SILICON
    DEAK, P
    SNYDER, LC
    [J]. PHYSICAL REVIEW B, 1987, 36 (18): : 9619 - 9627
  • [3] DEAK P, 1989, DEFECTS SEMICONDUCTO, V15, P281
  • [4] EFFECT OF HEAT TREATMENT UPON THE ELECTRICAL PROPERTIES OF SILICON CRYSTALS
    FULLER, CS
    LOGAN, RA
    [J]. JOURNAL OF APPLIED PHYSICS, 1957, 28 (12) : 1427 - 1436
  • [5] COMPARATIVE-STUDY OF SI-NL8 AND SI-NL10 THERMAL-DONOR-RELATED EPR CENTERS
    GREGORKIEWICZ, T
    BEKMAN, HHPT
    AMMERLAAN, CAJ
    [J]. PHYSICAL REVIEW B, 1990, 41 (18): : 12628 - 12637
  • [6] STRUCTURE OF THE 0.767-EV OXYGEN-CARBON LUMINESCENCE DEFECT IN 450-DEGREES-C THERMALLY ANNEALED CZOCHRALSKI-GROWN SILICON
    KURNER, W
    SAUER, R
    DORNEN, A
    THONKE, K
    [J]. PHYSICAL REVIEW B, 1989, 39 (18): : 13327 - 13337
  • [7] ELECTRICAL AND OPTICAL CHARACTERIZATION OF THERMAL DONORS IN SILICON
    LATUSHKO, YI
    MAKARENKO, LF
    MARKEVICH, VP
    MURIN, LI
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1986, 93 (02): : K181 - K184
  • [8] STRUCTURE OF THERMAL DONORS (NL8) IN SILICON - A STUDY WITH ELECTRON-NUCLEAR DOUBLE-RESONANCE
    MICHEL, J
    NIKLAS, JR
    SPAETH, JM
    [J]. PHYSICAL REVIEW B, 1989, 40 (03): : 1732 - 1747
  • [9] NEWMAN RC, 1990, 12TH P ICPS THESS
  • [10] NEWMAN RC, 1989, I PHYS C SER, V95, P211