THE PROBLEMS OF TESTING LARGE-SCALE INTEGRATED-CIRCUITS

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作者：
WATERS, DGP
机构：
来源：
BRITISH TELECOMMUNICATIONS ENGINEERING | 1982年 / 1卷 / JUL期
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：64 / 69
页数：6
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