THE PROBLEMS OF TESTING LARGE-SCALE INTEGRATED-CIRCUITS

被引：0
|
作者：
WATERS, DGP
机构：
来源：
BRITISH TELECOMMUNICATIONS ENGINEERING | 1982年 / 1卷 / JUL期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：64 / 69
页数：6
相关论文
共 50 条
  • [31] EVALUATION TESTING OF INTEGRATED-CIRCUITS
    HOMAN, RA
    ROSSMAN, MW
    PROCEEDINGS ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM, 1975, (JAN28): : 372 - 376
  • [32] Large-scale photonic integrated circuits
    Nagarajan, R
    Joyner, CH
    Schneider, RP
    Bostak, JS
    Butrie, T
    Dentai, AG
    Dominic, VG
    Evans, PW
    Kato, M
    Kauffman, M
    Lambert, DJH
    Mathis, SK
    Mathur, A
    Miles, RH
    Mitchell, ML
    Missey, MJ
    Murthy, S
    Nilsson, AC
    Peters, FH
    Pennypacker, SC
    Pleumeekers, JL
    Salvatore, RA
    Schlenker, RK
    Taylor, RB
    Tsai, HS
    Van Leeuwen, MF
    Webjorn, J
    Ziari, M
    Perkins, D
    Singh, J
    Grubb, SG
    Reffle, MS
    Mehuys, DG
    Kish, FA
    Welch, DF
    IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2005, 11 (01) : 50 - 65
  • [33] AUTOMATIC TESTING OF INTEGRATED-CIRCUITS
    BETTE, HP
    ELECTRONICS AND POWER, 1977, 23 (05): : 380 - 384
  • [34] Large-scale photonic integrated circuits
    Nagarajan, Radhakrishnan
    Kato, Masaki
    Pleumeekers, Jacco
    Evans, Peter
    Hurtt, Sheila
    Dentai, Andrew
    Missey, Mark
    Chen, Arnold
    Mathur, Atul
    Lambert, Damien
    Chavarkar, Prashant
    Baeck, Johan
    Muthiah, Ranjani
    Murthy, Sanjeev
    Salvatore, Randal
    Joyner, Charles
    Rossi, Jon
    Schneider, Richard
    Ziari, Mehrdad
    2007 INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS, CONFERENCE PROCEEDINGS, 2007, : 32 - 34
  • [35] WSI, INTERCONNECTIONS FOR VERY-LARGE-SCALE INTEGRATED-CIRCUITS
    SARASWAT, KC
    THIN SOLID FILMS, 1981, 83 (02) : 143 - 144
  • [36] LARGE-SCALE INTEGRATED-CIRCUITS TECHNOLOGY - STATE OF THE ART AND PROSPECTS - ESAKI,L, SONCINI,G
    SOMA, M
    AMERICAN SCIENTIST, 1984, 72 (02) : 215 - 215
  • [37] SUBCOMPUTER CONCEPT - POSSIBILITY TO ADAPT COMPUTER STRUCTURES TO SYSTEM SPECIFICATIONS OF LARGE-SCALE INTEGRATED-CIRCUITS
    PFORDTEN, DV
    DEIS, A
    ANGEWANDTE INFORMATIK, 1975, (01): : 9 - 14
  • [38] EFFECTIVE TESTING OF DIGITAL INTEGRATED-CIRCUITS
    PADWICK, GC
    SOLID STATE TECHNOLOGY, 1972, 15 (03) : 46 - &
  • [39] OPERATIONAL LIFE TESTING OF INTEGRATED-CIRCUITS
    FARNHOLTZ, DF
    PROCEEDINGS ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM, 1985, (NSYM): : 441 - 443
  • [40] Scalability of Large-Scale Photonic Integrated Circuits
    Su, Yikai
    He, Yu
    Guo, Xuhan
    Xie, Weiqiang
    Ji, Xingchen
    Wang, Hongwei
    Cai, Xinlun
    Tong, Limin
    Yu, Siyuan
    ACS PHOTONICS, 2023, 10 (07) : 2020 - 2030
12345