ULTRA-LARGE-SCALE INTEGRATION DEVICE SCALING AND RELIABILITY

被引：14
作者：
HU, CM
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 06期
关键词：
D O I：
10.1116/1.587505
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：3237 / 3241
页数：5
相关论文
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