HIGH QUANTUM EFFICIENCY PHOTOLUMINESCENCE FROM LOCALIZED EXCITONS IN SI1-XGEX

被引:74
作者
LENCHYSHYN, LC
THEWALT, MLW
STURM, JC
SCHWARTZ, PV
PRINZ, EJ
ROWELL, NL
NOEL, JP
HOUGHTON, DC
机构
[1] PRINCETON UNIV,DEPT ELECT ENGN,PRINCETON,NJ 08544
[2] NATL RES COUNCIL CANADA,OTTAWA K1A 0R6,ONTARIO,CANADA
关键词
D O I
10.1063/1.106733
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report a new photoluminescence process in epitaxial Si1-xGex, layers grown on Si by rapid thermal chemical vapor deposition which we attribute to the recombination of excitons localized at random alloy fluctuations. This luminescence is characterized by saturation at very low excitation densities (congruent-to 100-mu-W cm-2), very long decay times (> 1 ms), and high quantum efficiency at low excitation. We have directly measured an external photoluminescence quantum efficiency of 11.5+/-2%.
引用
收藏
页码:3174 / 3176
页数:3
相关论文
共 24 条
  • [1] FLUORESCENCE LINE NARROWING, LOCALIZED EXCITON-STATES, AND SPECTRAL DIFFUSION IN THE MIXED SEMICONDUCTOR CDSXSE1-X
    COHEN, E
    STURGE, MD
    [J]. PHYSICAL REVIEW B, 1982, 25 (06) : 3828 - 3840
  • [2] EXCITONIC PHOTOLUMINESCENCE FROM SI-CAPPED STRAINED SI1-XGEX LAYERS
    DUTARTRE, D
    BREMOND, G
    SOUIFI, A
    BENYATTOU, T
    [J]. PHYSICAL REVIEW B, 1991, 44 (20): : 11525 - 11527
  • [3] DISLOCATION-FREE STRANSKI-KRASTANOW GROWTH OF GE ON SI(100)
    EAGLESHAM, DJ
    CERULLO, M
    [J]. PHYSICAL REVIEW LETTERS, 1990, 64 (16) : 1943 - 1946
  • [4] EXCITONIC MOBILITY EDGE IN GAASXP1-X
    GERSHONI, D
    COHEN, E
    RON, A
    [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (20) : 2211 - 2214
  • [5] TEMPERATURE-DEPENDENCE OF THE EXCITON LIFETIME IN HIGH-PURITY SILICON
    HAMMOND, RB
    SILVER, RN
    [J]. APPLIED PHYSICS LETTERS, 1980, 36 (01) : 68 - 71
  • [6] DIRECT IMAGING OF INTERFACIAL ORDERING IN ULTRATHIN (SIMGEN)P SUPERLATTICES
    JESSON, DE
    PENNYCOOK, SJ
    BARIBEAU, JM
    [J]. PHYSICAL REVIEW LETTERS, 1991, 66 (06) : 750 - 753
  • [7] PHOTOLUMINESCENCE STUDY OF EXCITONS LOCALIZED IN INDIRECT-GAP GAAS1-XPX
    LAI, ST
    KLEIN, MV
    [J]. PHYSICAL REVIEW B, 1984, 29 (06): : 3217 - 3224
  • [8] LEGOUES FK, 1991, PHYS REV LETT, V66, P750
  • [9] PHOTO-LUMINESCENCE OF SI-RICH SI-GE ALLOYS
    MITCHARD, GS
    MCGILL, TC
    [J]. PHYSICAL REVIEW B, 1982, 25 (08): : 5351 - 5363
  • [10] INTENSE PHOTOLUMINESCENCE BETWEEN 1.3-MU AND 1.8-MU-M FROM STRAINED SI1-XGEX ALLOYS
    NOEL, JP
    ROWELL, NL
    HOUGHTON, DC
    PEROVIC, DD
    [J]. APPLIED PHYSICS LETTERS, 1990, 57 (10) : 1037 - 1039