COMPARATIVE-STUDY OF TITANIUM-DIOXIDE THIN-FILMS PRODUCED BY ELECTRON-BEAM EVAPORATION AND BY REACTIVE LOW-VOLTAGE ION PLATING

被引:48
作者
BALASUBRAMANIAN, K
HAN, XF
GUENTHER, KH
机构
来源
APPLIED OPTICS | 1993年 / 32卷 / 28期
关键词
TIO2 THIN FILMS; OPTICAL CONSTANTS; ELECTRON-BEAM EVAPORATION; ION PLATING; THIN FILMS;
D O I
10.1364/AO.32.005594
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Titanium dioxide (TiO2) is often used as a high refractive-index material for multilayer optical coatings. However, the optical properties of TiO2 films depend strongly on the deposition process and its parameters. A comparative study of TiO2 films fabricated by conventional electron-beam evaporation and by reactive low-voltage ion plating that uses different phases of Ti-O as starting materials is reported. Results on the variability of TiO2 thin films are analyzed in relation to process parameters. The potential of fabricating high and low refractive-index multilayer stacks with TiO2 only, by employing two different deposition processes, is presented with a practical example.
引用
收藏
页码:5594 / 5600
页数:7
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