COMPARATIVE-ANALYSIS OF DIFFERENT IMPLEMENTATIONS OF MULTIPLE-INPUT SIGNATURE ANALYZERS

被引：2
作者：
MAXWELL, PC
机构：
[1] UNIV NEW S WALES,DEPT COMP SCI,SYDNEY,NSW 2033,AUSTRALIA
[2] UNIV NEW S WALES,JOINT MICROELECTR RES CTR,SYDNEY,NSW 2033,AUSTRALIA
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1988年 / 37卷 / 11期
关键词：
D O I：
10.1109/12.8706
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：1411 / 1414
页数：4
相关论文
共 22 条
[1]  
BARDELL PH, 1984, P INT TEST C IEEE, P302
[2]  
Barzilai Z., 1983, P INT TEST C, P89
[3]   ADVANCED FAULT ISOLATION SYSTEM FOR DIGITAL LOGIC [J].
BENOWITZ, N ;
CALHOUN, DF ;
ALDERSON, GE ;
BAUER, JE ;
JOECKEL, CT .
IEEE TRANSACTIONS ON COMPUTERS, 1975, C 24 (05) :489-497
[4]  
BHASKAR K, 1982, P IEEE TEST C, P132
[5]  
BHAVSAR DK, 1981, P IEEE TEST C, P208
[6]   RANDOM-PATTERN COVERAGE ENHANCEMENT AND DIAGNOSIS FOR LSSD LOGIC SELF-TEST [J].
EICHELBERGER, EB ;
LINDBLOOM, E .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1983, 27 (03) :265-272
[7]  
HASSAN SZ, 1984, P IEEE TEST C, P320
[8]  
HASSAN SZ, 1982, CSL TN203 STANF U CT
[9]  
HASSAN SZ, 1984, P ICCAD 84, P102
[10]  
HASSAN SZ, 1983, SPR P COMPCON 83, P440
123