SEM SAMPLE PREPARATION WITH ANTI-STATIC SOLUTION (11)

被引：0
|
作者：
KATOH, M [1 ]
MATSUMOTO, K [1 ]
机构：
[1] NISSEI SANGYO CO LTD,SI CENT,TOKYO,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1978年 / 27卷 / 04期
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
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页码：361 / 361
页数：1
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