SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM) AND ITS APPLICATION IN MINERALOGY

被引：0
作者：
GUTMANNSBAUER, W
HUSER, T
LACOSTE, T
HEINZELMANN, H
GUNTHERODT, HJ
机构：
来源：
SCHWEIZERISCHE MINERALOGISCHE UND PETROGRAPHISCHE MITTEILUNGEN | 1995年 / 75卷 / 02期
关键词：
SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SCANNING FORCE MICROSCOPY; OPTICAL MICROSCOPY; DIFFRACTION LIMIT; RESOLUTION; SHEAR FORCE IMAGE; SPECTROSCOPY;
D O I：
暂无
中图分类号：
P5 [地质学];
学科分类号：
0709 ; 081803 ;
摘要：
Scanning near-field optical microscopy (SNOM) is a member of the family of scanning probe microscopes. It combines the high three dimensional resolution of a scanning force microscope with the contrast mechanisms of an optical microscope. An optical resolution beyond the diffraction limit can be achieved. We show the first application of this technique in the field of mineralogy, and we point out its future potential.
引用
收藏
页码：259 / 264
页数：6
相关论文
共 26 条
[1]  
Abbe E, 1873, ARCH MIKROSK ANAT, V9, P413, DOI [DOI 10.1007/BF02956173, 10.1007/BF02956173]
[2]   SUPER-RESOLUTION APERTURE SCANNING MICROSCOPE [J].
ASH, EA ;
NICHOLLS, G .
NATURE, 1972, 237 (5357) :510-&
[3]   REFLECTION-SCANNING NEAR-FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY OF OPAQUE SAMPLES [J].
BIELEFELDT, H ;
HORSCH, I ;
KRAUSCH, G ;
LUXSTEINER, M ;
MLYNEK, J ;
MARTI, O .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (02) :103-108
[4]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[5]  
FROMMER J, 1991, J PHYSICS CONDENSED, V3, P1
[6]   MOLECULAR-SCALE IMAGING OF CLAY MINERAL SURFACES WITH THE ATOMIC FORCE MICROSCOPE [J].
HARTMAN, H ;
SPOSITO, G ;
YANG, A ;
MANNE, S ;
GOULD, SAC ;
HANSMA, PK .
CLAYS AND CLAY MINERALS, 1990, 38 (04) :337-342
[7]   SCANNING NEAR-FIELD OPTICAL MICROSCOPY [J].
HEINZELMANN, H ;
POHL, DW .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (02) :89-101
[8]   ATOMIC-FORCE MICROSCOPY STUDIES OF LAYER SILICATE MINERALS [J].
HENDERSON, GS ;
VRDOLJAK, GA ;
EBY, RK ;
WICKS, FJ ;
RACHLIN, AL .
COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS, 1994, 87 (03) :197-212
[9]  
HILLNER PE, 1992, GEOLOGY, V20, P359, DOI 10.1130/0091-7613(1992)020<0359:ASIOCG>2.3.CO
[10]  
2
123