NOISE CHARACTERIZATION IN SCANNING-TUNNELING-MICROSCOPY (STM)

被引：2

作者：

AGUILAR, M

PANCORBO, M

机构：

[1] Instituto de Ciencia de Materiales, Sede B (CSIC), Universidad Autónoma de Madrid (C-III)

来源：

PATTERN RECOGNITION LETTERS | 1994年 / 15卷 / 10期

关键词：

STM; TUNNELING; MICROSCOPY; NOISE; SCANNING-TUNNELING-MICROSCOPE; FRACTAL;

D O I：

10.1016/0167-8655(94)90030-2

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

In this paper we discuss the characterization of noise in STM. The characteristic noise in STM images is the 1/f(beta)-like one, thus noise is characterized by giving the beta value. We show that the method (proposed by Stoll and Marti) utilized by STM users for measurement of beta is erroneous. We propose here a new method for noise characterization by frequency analysis based on image replication that yields accurate values of the beta exponent.

引用

页码：985 / 992

页数：8

共 8 条

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[6] PICTURE-PROCESSING AND 3-DIMENSIONAL VISUALIZATION OF DATA FROM SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPY [J].

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[7]

Voss R.F., 1988, SCI FRACTAL IMAGES, P21, DOI 10.1007/978-1-4612-3784-6_1

[8]

Voss R. F., 1985, FUNDAMENTAL ALGORITH, P805

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