WHITE-LIGHT EXTENDED SOURCE AC SHEARING INTERFEROMETER

被引：0
|
作者：
WYANT, JC [1 ]
机构：
[1] ITEK CORP,OPTICAL SYST DIV,LEXINGTON,MA 02173
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1972年 / 62卷 / 11期
关键词：
D O I：
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中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：1364 / 1364
页数：1
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