ERROR EFFECTS IN THE ELLIPSOMETRIC INVESTIGATION OF THIN-FILMS

[1] Azzam RMA, 1977, ELLIPSOMETRY POLARIZ

[2] MINORITY-CARRIER MIS TUNNEL-DIODES AND THEIR APPLICATION TO ELECTRON-VOLTAIC AND PHOTO-VOLTAIC ENERGY-CONVERSION .1. THEORY [J]. SOLID-STATE ELECTRONICS, 1974, 17 (06) : 551 - 561

[3] HUND F, 1957, THEORETISCHE PHYSIK, V2

[4] POROSITY OF MGF2 FILMS - EVALUATION BASED ON CHANGES IN REFRACTIVE INDEX DUE TO ADSORPTION OF VAPORS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04): : 730 - +

[5] Lichtenecker K., 1926, PHYS Z, V27, P115

[6] MCCRACKIN FL, 1969, NBS479 US TECH NOT

[7] POHL RW, 1940, OPTIK

[8] EVALUATION OF ADJUSTMENT DATA FOR SIMPLE ELLIPSOMETERS [J]. THIN SOLID FILMS, 1979, 61 (03) : 335 - 340

[9] RIEDLING K, 1979, THESIS TU WIEN AUSTR

[10] MINORITY-CARRIER MIS TUNNEL-DIODES AND THEIR APPLICATION TO ELECTRON-VOLTAIC AND PHOTO-VOLTAIC ENERGY-CONVERSION .2. EXPERIMENT [J]. SOLID-STATE ELECTRONICS, 1974, 17 (06) : 563 - 572

[1] Azzam RMA, 1977, ELLIPSOMETRY POLARIZ

[2] MINORITY-CARRIER MIS TUNNEL-DIODES AND THEIR APPLICATION TO ELECTRON-VOLTAIC AND PHOTO-VOLTAIC ENERGY-CONVERSION .1. THEORY [J]. SOLID-STATE ELECTRONICS, 1974, 17 (06) : 551 - 561

[3] HUND F, 1957, THEORETISCHE PHYSIK, V2

[4] POROSITY OF MGF2 FILMS - EVALUATION BASED ON CHANGES IN REFRACTIVE INDEX DUE TO ADSORPTION OF VAPORS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04): : 730 - +

[5] Lichtenecker K., 1926, PHYS Z, V27, P115

[6] MCCRACKIN FL, 1969, NBS479 US TECH NOT

[7] POHL RW, 1940, OPTIK

[8] EVALUATION OF ADJUSTMENT DATA FOR SIMPLE ELLIPSOMETERS [J]. THIN SOLID FILMS, 1979, 61 (03) : 335 - 340

[9] RIEDLING K, 1979, THESIS TU WIEN AUSTR

[10] MINORITY-CARRIER MIS TUNNEL-DIODES AND THEIR APPLICATION TO ELECTRON-VOLTAIC AND PHOTO-VOLTAIC ENERGY-CONVERSION .2. EXPERIMENT [J]. SOLID-STATE ELECTRONICS, 1974, 17 (06) : 563 - 572