DIFFUSION OF ION-IMPLANTED GOLD IN P-TYPE SILICON

被引:23
作者
COFFA, S [1 ]
CALCAGNO, L [1 ]
CAMPISANO, SU [1 ]
CALLERI, G [1 ]
FERLA, G [1 ]
机构
[1] SGS MICROELETTR,CATANIA,ITALY
关键词
D O I
10.1063/1.342087
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:6291 / 6295
页数:5
相关论文
共 11 条
[1]   PROPERTIES OF GOLD IN SILICON [J].
BULLIS, WM .
SOLID-STATE ELECTRONICS, 1966, 9 (02) :143-&
[2]   ENTROPY FACTOR OF DONOR LEVEL IN GOLD IMPLANTED SILICON [J].
COFFA, S ;
CALLERI, G ;
CALCAGNO, L ;
CAMPISANO, SU ;
FERLA, G .
APPLIED PHYSICS LETTERS, 1988, 52 (07) :558-560
[3]  
COFFA S, IN PRESS J ELECTROCH
[4]   MECHANISM OF DIFFUSION OF COPPER IN GERMANIUM [J].
FRANK, FC ;
TURNBULL, D .
PHYSICAL REVIEW, 1956, 104 (03) :617-618
[5]   DIFFUSION OF GOLD IN SILICON - A NEW MODEL [J].
GOSELE, U ;
MOREHEAD, F ;
FRANK, W ;
SEEGER, A .
APPLIED PHYSICS LETTERS, 1981, 38 (03) :157-159
[6]   MECHANISM AND KINETICS OF THE DIFFUSION OF GOLD IN SILICON [J].
GOSELE, U ;
FRANK, W ;
SEEGER, A .
APPLIED PHYSICS, 1980, 23 (04) :361-368
[7]   SELF-INTERSTITIAL AND VACANCY CONTRIBUTIONS TO SILICON SELF-DIFFUSION DETERMINED FROM THE DIFFUSION OF GOLD IN SILICON [J].
MOREHEAD, F ;
STOLWIJK, NA ;
MEYBERG, W ;
GOSELE, U .
APPLIED PHYSICS LETTERS, 1983, 42 (08) :690-692
[8]   ON THE THEORY OF THE DIFFUSION OF GOLD INTO SILICON [J].
SEEGER, A .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 61 (02) :521-529
[9]   DIFFUSION OF GOLD IN SILICON STUDIED BY MEANS OF NEUTRON-ACTIVATION ANALYSIS AND SPREADING-RESISTANCE MEASUREMENTS [J].
STOLWIJK, NA ;
SCHUSTER, B ;
HOLZL, J .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1984, 33 (02) :133-140
[10]   DIFFUSION OF GOLD IN DISLOCATION-FREE OR HIGHLY DISLOCATED SILICON MEASURED BY THE SPREADING-RESISTANCE TECHNIQUE [J].
STOLWIJK, NA ;
HOLZL, J ;
FRANK, W ;
WEBER, ER ;
MEHRER, H .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1986, 39 (01) :37-48