ACCURACY AND OPTIMIZATION OF 2 POLARIZATION TECHNIQUE FOR OBTAINING OPTICAL-CONSTANTS FROM ATTENUATED TOTAL REFLECTION MEASUREMENTS

被引：7
作者：
HIRSCHFELD, T
机构：
来源：
APPLIED SPECTROSCOPY | 1978年 / 32卷 / 02期
关键词：
D O I：
10.1366/000370278774331558
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
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页码：160 / 164
页数：5
相关论文
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[5]   SUBSURFACE LAYER STUDIES BY ATTENUATED TOTAL REFLECTION FOURIER-TRANSFORM SPECTROSCOPY [J].
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[6]   ACCURACY AND OPTIMIZATION OF 2 PRISM TECHNIQUE FOR CALCULATING OPTICAL CONSTANTS FROM ATR DATA [J].
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