EFFECT OF INSIDE-SPREAD SURFACE-STATES ON FERMI LEVEL PINNING

被引:3
|
作者
PALAU, JM
DUMAS, M
机构
[1] Laboratoire d'Etude des Surfaces, Interfaces et Composants, UA CNRS D07870, CP 088, Université de Montpellier II Sciences et Techniques du Languedoc, Place Eugène Bataillon
关键词
D O I
10.1016/0039-6028(90)90085-M
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The potential distribution in the space charge zone when bulk electronic states are present is calculated. This is used to quantitatively examine the hypothesis that surface states responsible for the Fermi level pinning on III-V materials are spread over several angstrom inside the semiconductor. They are called inside-spread surface states due to the nature of their origin. It is found that variations in the penetration depth of the states, when at least one donor-acceptor pair is present, can explain for the most part the experimental behaviour. When both true-surface and inside-spread states are present, it is found that the ones closest to the interior generally accounts for the Schottky barrier height (even more so when their density and/or their penetration depth are high). To conclude, the hypothesis that surface states can penetrate into the semiconductor should be considered in any attempt to explain pinning position movement. © 1990.
引用
收藏
页码:271 / 279
页数:9
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