CAPACITANCE-VOLTAGE CHARACTERISTICS OF ALTERNATING-CURRENT THIN-FILM ELECTROLUMINESCENT DEVICES

被引：18
|
作者：
MCARTHUR, RC [1 ]
DAVIDSON, JD [1 ]
WAGER, JF [1 ]
KHORMAEI, I [1 ]
KING, CN [1 ]
机构：
[1] PLANAR SYST INC,BEAVERTON,OR 97006
来源：
APPLIED PHYSICS LETTERS | 1990年 / 56卷 / 19期
关键词：
D O I：
10.1063/1.103078
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The capacitance-voltage (C-V) technique is proposed as a method for characterization of the electrical properties of alternating-current thin-film electroluminescent (ACTFEL) display devices. Analysis of the C-V and aging characteristics of ZnS:Mn ACTFEL devices indicates that the C-V technique is complementary to the charge-voltage technique in the extraction of device physics information.
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页码：1889 / 1891
页数：3
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