CAPACITANCE-VOLTAGE CHARACTERISTICS OF ALTERNATING-CURRENT THIN-FILM ELECTROLUMINESCENT DEVICES

被引：18

作者：

MCARTHUR, RC ^{[1
]}

DAVIDSON, JD ^{[1
]}

WAGER, JF ^{[1
]}

KHORMAEI, I ^{[1
]}

KING, CN ^{[1
]}

机构：

[1] PLANAR SYST INC,BEAVERTON,OR 97006

来源：

APPLIED PHYSICS LETTERS | 1990年 / 56卷 / 19期

关键词：

D O I：

10.1063/1.103078

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The capacitance-voltage (C-V) technique is proposed as a method for characterization of the electrical properties of alternating-current thin-film electroluminescent (ACTFEL) display devices. Analysis of the C-V and aging characteristics of ZnS:Mn ACTFEL devices indicates that the C-V technique is complementary to the charge-voltage technique in the extraction of device physics information.

引用

页码：1889 / 1891

页数：3

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