ANGULAR-DEPENDENCE OF AUGER-ELECTRON EMISSION FROM MGO AND NIO

Angular Auger profiles have been obtained from the vacuum-cleaved (100) surfaces of MgO and NiO using LEED optics and a spot photometer. Data for Mg L2, 3VV, Ni M2, 3VV and Ni M2, 3V in the [001] and [011] azimuths are presented. The results are compared with profiles expected from s, p, d, f and g wave sources with LEED final states. The g wave (l = 4) source provides the best fit for the Ni M2, 3VV peak profiles but the quality of agreement is not good and theory predicts that l = 3 should dominate. For Mg L2, 3VV the best fit" is for l = 3 in the [001] azimuth and l = 4 in the [011] azimuth where theory predicts that l = 1 should dominate in both azimuths. These discrepancies are discussed and the possibility of non-localised Auger sources and effects due to anion polarization are suggested. © 1979."