SIMPLE REFLECTION TECHNIQUE FOR MEASURING THE ELECTROOPTIC COEFFICIENT OF POLED POLYMERS

被引：747

作者：

TENG, CC

MAN, HT

机构：

[1] Hoechst Celanese Research Division, Summit, NJ 07901

来源：

APPLIED PHYSICS LETTERS | 1990年 / 56卷 / 18期

关键词：

D O I：

10.1063/1.103107

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A simple reflection technique for measuring the electro-optic coefficient of nonlinear optical polymeric films is described. The technique is based on the polarization rotation of a laser beam due to the electro-optic effect. It requires no waveguiding and can be used to measure polymeric films during, as well as after, the electrical poling process. The results are in excellent agreement with those obtained from the more conventional but much more time consuming waveguiding method.

引用

页码：1734 / 1736

页数：3

共 7 条

[1]

CROSS GH, 1989, 1989 P SPIE S OPT FI, V1177, P79

[2]

HAAS DR, 1989, 1989 P SPIE S OPT FI, V1147, P222

[3] SIMPLE MEASURING METHOD FOR ELECTRO-OPTIC COEFFICIENTS IN POLED POLYMER WAVE-GUIDES [J].

HORSTHUIS, WHG ;

KRIJNEN, GJM .

APPLIED PHYSICS LETTERS, 1989, 55 (07) :616-618

[4]

MCDONACH A, 1989, 1989 P SPIE S OPT FI, V1177, P57

[5]

MOHLMANN GR, 1989, 1989 P SPIE S OPT FI, V1147, P245

[6] 2ND HARMONIC-GENERATION IN POLED POLYMER-FILMS [J].

SINGER, KD ;

SOHN, JE ;

LALAMA, SJ .

APPLIED PHYSICS LETTERS, 1986, 49 (05) :248-250

[7]

TENG CC, 1988, Patent No. 4767169

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