FERMI-SURFACE STUDIES BY THE POSITRON-ANNIHILATION TECHNIQUE

被引：0

作者：

MANUEL, AA ^{[1
]}

SAMOILOV, S ^{[1
]}

FISCHER, O ^{[1
]}

PETER, M ^{[1
]}

JEAVONS, AP ^{[1
]}

机构：

[1] CERN,CH-1211 GENEVA 23,SWITZERLAND

来源：

HELVETICA PHYSICA ACTA | 1979年 / 52卷 / 01期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：37 / 41

页数：5

共 9 条

[1]

BERKO S, 1975, J APPL PHYS, V5, P287

[2]

HALSE RM, 1969, PHIL T ROYAL SOC L A, V269, P507

[3] PROPORTIONAL CHAMBER GAMMA CAMERA [J].

JEAVONS, AP ;

CATE, C .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1976, 23 (01) :640-641

[4] HIGH-RESOLUTION PROPORTIONAL CHAMBER POSITRON CAMERA AND ITS APPLICATIONS [J].

JEAVONS, AP ;

TOWNSEND, DW ;

FORD, NL ;

KULL, K ;

MANUEL, A ;

FISCHER, O ;

PETER, M .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1978, 25 (01) :164-173

[5] APPLICATION OF PROPORTIONAL CHAMBERS TO MEASUREMENT OF ELECTRONIC PROPERTIES OF SOLIDS BY POSITRON-ANNIHILATION [J].

MANUEL, AA ;

FISCHER, O ;

PETER, M ;

JEAVONS, AP .

NUCLEAR INSTRUMENTS & METHODS, 1978, 156 (1-2) :67-71

[6]

MANUEL AA, 1978, J PHYSIQUE C, V6, P1084

[7]

MANUEL AA, 1978, THESIS U GENEVA

[8]

PETER M, UNPUBLISHED

[9]

VANKESSEL AT, 1978, J PHYSIQUE C, V6, P414

← 1 →