MULTIPLE GUINIER CAMERAS

[1] DEWOLFF PM, 1948, APPL SCI RES B-ELEC, V1, P119

[2] Guinier A., 1945, RADIOCRISTALLOGRAPHI

[3] Guinier A., 1939, ANN PHYS-LEIPZIG, V12, P161, DOI DOI 10.1051/ANPHYS/193911120161

[4] Chemical analysis by x-ray diffraction - Classification and use of x-ray diffraction patterns [J]. INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION, 1938, 10 : 0457 - 0512

[5] MENZER G, 1932, FORTSCHR MIN, V60, P162

[1] DEWOLFF PM, 1948, APPL SCI RES B-ELEC, V1, P119

[2] Guinier A., 1945, RADIOCRISTALLOGRAPHI

[3] Guinier A., 1939, ANN PHYS-LEIPZIG, V12, P161, DOI DOI 10.1051/ANPHYS/193911120161

[4] Chemical analysis by x-ray diffraction - Classification and use of x-ray diffraction patterns [J]. INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION, 1938, 10 : 0457 - 0512

[5] MENZER G, 1932, FORTSCHR MIN, V60, P162