共 5 条
[1]
DEWOLFF PM, 1948, APPL SCI RES B-ELEC, V1, P119
[2]
Guinier A., 1945, RADIOCRISTALLOGRAPHI
[3]
Guinier A., 1939, ANN PHYS-LEIPZIG, V12, P161, DOI DOI 10.1051/ANPHYS/193911120161
[4]
Chemical analysis by x-ray diffraction - Classification and use of x-ray diffraction patterns
[J].
INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION,
1938, 10
:0457-0512
[5]
MENZER G, 1932, FORTSCHR MIN, V60, P162