THE COMPUTER DIAGNOSTICS OF SEMICONDUCTOR CRYSTALS

被引：0
|
作者：
GONCHARSKII, AV
STEPANOV, AA
机构：
来源：
DOKLADY AKADEMII NAUK SSSR | 1987年 / 292卷 / 01期
关键词：
D O I：
暂无
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
引用
收藏
页码：60 / 63
页数：4
相关论文
共 50 条
  • [41] Luminescent purity diagnostics of ZnSe crystals
    Vakulenko, OV
    Kravchenko, VM
    Janchuk, ZZ
    INTERNATIONAL CONFERENCE ON OPTICAL DIAGNOSIS OF MATERIALS AND DEVICES FOR OPTO-, MICRO-, AND QUANTUM ELECTRONICS 1997, 1998, 3359 : 222 - 226
  • [42] ON THE SURFACE DECOMPOSITION OF SEMICONDUCTOR CRYSTALS
    KOSEVICH, VM
    VETCHINKINA, ZK
    IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII FIZIKA, 1980, (06): : 92 - 93
  • [43] Semiconductor photonic crystals and devices
    Noda, S
    ECOC'01: 27TH EUROPEAN CONFERENCE ON OPTICAL COMMUNICATION, VOLS 1-6, 2001, : 512 - 513
  • [44] On the dissociation of dislocations in semiconductor crystals
    Vanderschaeve, Guy
    Caillard, Daniel
    15TH INTERNATIONAL CONFERENCE ON THE STRENGTH OF MATERIALS (ICSMA-15), 2010, 240
  • [45] Semiconductor nanorod liquid crystals
    Li, LS
    Walda, J
    Manna, L
    Alivisatos, AP
    NANO LETTERS, 2002, 2 (06) : 557 - 560
  • [46] HYDROPLANE POLISHING OF SEMICONDUCTOR CRYSTALS
    GORMLEY, JV
    MANFRA, MJ
    CALAWA, AR
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (08) : 1256 - 1259
  • [47] On the mobility of dislocations in semiconductor crystals
    Vanderschaeve, Guy
    Caillard, Daniel
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2007, 462 (1-2): : 418 - 421
  • [48] Semiconductor excitons in photonic crystals
    Eichmann, R
    Pasenow, B
    Meier, T
    Stroucken, T
    Thomas, P
    Koch, SW
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 2003, 238 (03): : 439 - 442
  • [49] Equipment for Testing and Diagnostics of Power Semiconductor Devices
    Bespalov, N. N.
    Ilyin, M. V.
    Kapitonov, S. S.
    2015 INTERNATIONAL SIBERIAN CONFERENCE ON CONTROL AND COMMUNICATIONS (SIBCON), 2015,
  • [50] Plasma ion diagnostics using semiconductor detectors
    Hirata, M
    Cho, T
    Sakamoto, Y
    Kohagura, J
    Kanke, S
    Takahashi, K
    Okamura, T
    Nakashima, Y
    Yatsu, K
    Tamano, T
    Kondoh, T
    Miyoshi, S
    ICPP 96 CONTRIBUTED PAPERS - PROCEEDINGS OF THE 1996 INTERNATIONAL CONFERENCE ON PLASMA PHYSICS, VOLS 1 AND 2, 1997, : 1478 - 1481
12345